A research team led by Kye Myong Ho, an institute head at the Faculty of Metal Engineering, has developed an energy dispersive X-ray fluorescence (EDXRF) analyzer.
The analyzer has several advantages: nondestructive analysis without any chemical reagents, simultaneous analysis of several elements in a short time, very simple structure, wide range of concentration standardless analysis and convenience in use.
It is made up of a high voltage power unit, an x-ray tube, a semiconductor detector, a multi-channel pulse height analyzer, a control circuit, a vacuum pump and analysis software.
The maximum power of the x-ray tube is 50W and the energy resolution of the semiconductor detector is 149eV. The analyzer enables measurement in the vacuum and its measuring time is below 5 minutes.
The analytical software is used for instrument control, qualitative analysis, semi-quantitative analysis, calibration curve drawing and quantitative analysis.
In the software, the voltage and current of the x-ray tube are set according to elements, and fluorescence spectrum is collected. Semi-quantitative analysis is available by standardless analysis. For semi-quantitative analysis, the kind of sample must be selected before measuring. You can also make a quantitative analysis by a standard curve. First, you should select the standard curve for a sample, and then quantitative analysis result is presented.
EDXRF analyzer can be widely used for analysing element concentration of substances such as alloy, mineral, cement, precious metals and catalyzers in the fields like metal, chemical, building materials, mining industries, prospecting and archaeology.
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